JEOL Ltd. was founded in 1949 and is a leading Japanese manufacturer of advanced scientific instruments such as Electron Microscopes, Scanning Probe Microscopes, Semiconductor Inspection Tools, NMR, ESR and Mass Spectrometers.
JEOL (Skandinaviska) AB manges sales and services in Sweden, Finland, Norway, Denmark, Iceland, Estonia, Latvia and Lithuania.
JEOL (Skandinaviska) AB is also the global distributor of Semafore digitizer for SEM and PAMS Prealigner Microscope Systems for E-beam cassettes, which in most countries is sold by local JEOL company or sales representative. Download Company Profile Brochure
JASM-6200 Scanning Electron Microscope ClairScope™A Scanning Electron Microscope capable of sample imaging in atmosphere... Read more
JEM-ARM200F, An Ultimate Atomic Resolution Transmission Electron Microscope Read more
JCM-5000 NeoScope Nikon and JEOL join forces to introduce a powerful yet economic benchtop SEM. For more information please follow the link to Nikon website who will handle all sales activities on this product. Nikon instruments
JSM-6510 and JSM-6610 are two new High performance Scanning Electron Microscopes with improved performance and ease of operation, developed to meet demanding needs by researchers in a wide variety of scientific research and industrial fields.Read more
JSM-7600F A New and powerful Thermal FE-SEM combining ultra high resolution imaging and enhanced analytical capabilities Read more
JIB-4600F A highly stable probe current and aperture control lens facilitate high resolution image acquisition. The milling process is simultaneously viewed and analyzed in SEM imaging, effective for inner structure analysis and TEM thin film sample preparation. Read more
JSM-7500F at Scandem in Copenhagen. Jeol Skandinaviska AB is celebrating its 35th anniversry showing the Ultra-high resolution FE SEM
The new ECS series of FT-NMRs achieves the highest sensitivity level in the world with its high performance auto tune probe. The compact system requires half of the installation space of a conventional unit. Advanced software and networking capability plus automatic routines simplify operation. Read More
MultiBeam, JIB-4500 - A New Milling and Imaging System
Featuring High Performance and Reliability to Meet Ubiquitous Needs Read More
JEOL Ships 10,000th Scanning Electron Microscope Industry's SEM of Choice for 31 Years We announce with pride the shipment of the 10,000th general scanning electron microscope in 31 years since our first model, JSM-T20, was installed in 1975. We could not have achieved this milestone without your continued patronage. Read More
JEOL(Skandinaviska)AB
Hammarbacken 6A, Box 716, 191 27 Sollentuna, Sweden.
E-mail: sales@jeol.se. Phone: +46 8 28 28 00. Fax: +46 8 29 16 47
